Title: Defect depth-profiling in kesterite absorber by means of chemical etching and surface analysis

Authors: Tiwari, K.J.; Fonoll Rubio, R.; Giraldo, S.; Calvo-Barrio, L.; Izquierdo-Roca, V.; Placidi, M.; Sanchez, Y.; Pérez-Rodríguez, A.; Saucedo, E.; Jehl Li-Kao, Z.
Journal: Applied Surface Science
Vol: 540
Number: 2
Start page: 148342-1
Last page: 148342-8
DOI: doi
Institutional repositories:
Year: 2021
Key: Article