Title: TEM insight into defects in ionic conductor thin layers and their effect in fast transport
Speakers: Yedra, L.; Blanco-Portals, J.; López-Conesa L.; Martín, G.; Ruiz-Caridad, A.;, Baiutti, F.; Chiabrera, F.; Diercks, D.; Cavallaro, A.; Garbayo, I.; Walls, M.; Lippert, T.; Pergolesi, D.; Niania, M.; Ruiz-González, L.; Kordatos, A.; Núñez, M.; Morata, A.; Chroneos, A.; Aguadero, A.; Kilner, J.; Tarancón, A.; Estradé, S.; Peiró, F.
Congress: 4th International ELECMI Workshop, Barcelona 27-28 Octubre 2022
Country: ESP
City: Barcelona
Organizing institutions:
Year: 2022