Title: The structural characterization of Bi2Te3 ordered 3D nano-networks by means of electron tomography and precession-assisted 4D-STEM
Speakers: Plana-Ruiz, S.; Blanco-Portals, J.; Estradé, S.; López-Conesa, L.; Vargas-Carosi, B.; Ruiz-Clavijo, A.; Caballero-Calero, O.; López-Haro, M.; Martín-González, M.; Peiró, F.  
Congress: 20th International Microscopy Congress – IMC20, International Federation of Societies for Microscopy and Korean Society of Microscopy, Busan, Korea, 10-15 Sept 2023) (Poster)
Country: KOR
City: Busan
Organizing institutions:
Year: 2023

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