Title: Simulation of STEM and iDPC images for developing novel identification and qualitative methods to detect anisotropic defects and vacancies.
Speakers: Pranjal, N.; Barthel, J.; López-Haro, M.; Calvino, J.J.; Chiabrera, F.; Baiutti, F.; Tarancón, A.; Peiró, F.; Yedra, Ll.; Estradé, S.
Congress: 20th International Microscopy Congress – IMC20, International Federation of Societies for Microscopy and Korean Society of Microscopy, Busan, Korea, 10-15 Sept 2023) (Poster)
Country: KOR
City: Busan
Organizing institutions:
Year: 2023