Title: Measurement of local dielectric function of HfO2 Thin Layer with different crystallographic phases from EELS Analysis.
Speakers: Vargas, B.; Nasiou, D.; Molina-Luna, L.; Coll, C.; Del Pozo Bueno, D.; Nandi, P.; Yedra, L.; Kaiser, N.; Alff, L.; López-Conesa, L.; Peiró, F.
Congress: Microscopy at the Frontiers of Science 2023, Joint Congress of the Portuguese and Spanish Microscopy Societies, INL, Braga, Portugal, 27-29 September (2023) (Oral)
Country: PRT
City: Braga
Organizing institutions:
Year: 2023