Title: Dielectric function and electron energy loss function of HfO2 thin layers with hexagonal and rhombohedral phases by using EELS.
Speakers: Vargas, B.; Nasiou, D.; Molina-Luna, L.; Coll, C.; Del Pozo Bueno, D.; Nandi, P.; Yedra, L.; Kaiser, N.; Alff, L.; López-Conesa, L.; Peiró, F.
Congress: 20th International Microscopy Congress – IMC20, International Federation of Societies for Microscopy and Korean Society of Microscopy, Busan, Korea, 10-15 Sept 2023)
Country: KOR
City: Busan
Organizing institutions:
Year: 2023