Title: Defect depth-profiling in kesterite absorber by means of chemical etching and surface analysis
Speakers: Tiwari, K.; Fonoll-Rubio, R.; Giraldo, S.; Calvo-Barrio, L.; Izquierdo-Roca, V-;: Placidi, M.; Sanchez, Y.; Pérez-Rodríguez, A.; Saucedo, E.; Jehl Li-Kao, Z.
Congress: 11th European Kesterite Workshop
Country: DEU
City: Virtual
Organizing institutions:
Year: 2020