Smart Measurement system for the combined nanoscale and device level characterization of electron devices: implementation using ink-jet printing technologies
Authors: Claramunt, S.; Arrese, J.; Ruiz, A.; Porti, M.; Cirera, A.; Nafria, M.
Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
Authors: Checa, M.; Jin, X.; Millan-Solsona, R.; Neumayer, S. M.; Susner, M. A.; McGuire, M. A.; O'Hara, A.; Gomila, G.; Maksymovych, P.; Pantelides, S. T., Collins, L.