Title: Smart Measurement system for the combined nanoscale and device level characterization of electron devices: implementation using ink-jet printing technologies

Authors: Claramunt, S.; Arrese, J.; Ruiz, A.; Porti, M.; Cirera, A.; Nafria, M.
Journal: IEEE Transactions on Nanotechnology
Vol: 22
Number:
Start page: 28
Last page: 35
DOI: doi
Institutional repositories:
Year: 2023
Key: Article