Title: Correction of secondary fluorescence across phase boundaries in electron probe microanalysis of mineral inclusions

Authors: Llovet, X.; Proenza, J.A.; Pujol-Solà, N.; Farré-de-Pablo, J.; Campeny, M.
Journal: Microscopy and Microanalysis
Vol: 26
Number: 5
Start page: 895
Last page: 905
DOI: doi
Institutional repositories:
Year: 2020
Key: Article

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